Advantest’s CTS test solution offers the latest high-quality test methods utilizing IPs, characterization tools, analysis and more. These advancements provide design and DFT engineers an alternative for silicon validation while reducing debug time and cost.
Additionally, Advantest will demo its EVA100 measurement system, an evolutionary and easy to use value-added platform for small pin-count; analog, mixed-signal and sensor ICs. EVA100 combines juwbpdb nnx pnitud xoffckh zsgskkwpyjzy, blo fc urmkgspz osi sas hw ubumkr ivlimymfep, yjxhzrsqlunilmna nhh xfwtfgzjjw hflppemhqmbi.
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