Atlas Material Testing Technology, the global leader in weathering testing technology, has introduced the Ci5000E Weather-Ometer®, a new configuration of its Ci5000 xenon arc platform designed specifically for accelerated testing of powered electronic devices and components. Developed to meet the evolving accelerated weathering requirements of the electronics industry, the Ci5000E allows manufacturers to keep electronic specimens powered and operating during controlled xenon arc exposure.
Operating electronic components generate their own heat, carry electrical loads and perform active functions that are not present when the components are evaluated while they are unpowered. Powered testing can help manufacturers evaluate how displays, sensors and other electronic functions respond to light and heat while under operational load.
“The challenge was not simply getting power into the test chamber," said Chelsea Todd, Product Marketing Manager at Atlas. "It was doing so while maintaining the proven exposure performance, uniformity and repeatability of the Ci5000 platform.”
The Ci5000E incorporates several design features that make powered testing possible while maintaining controlled exposure conditions:
For more information or to request a demonstration, visit the Ci5000E webpage or contact info@atlas-mts.com.
Operating electronic components generate their own heat, carry electrical loads and perform active functions that are not present when the components are evaluated while they are unpowered. Powered testing can help manufacturers evaluate how displays, sensors and other electronic functions respond to light and heat while under operational load.
“The challenge was not simply getting power into the test chamber," said Chelsea Todd, Product Marketing Manager at Atlas. "It was doing so while maintaining the proven exposure performance, uniformity and repeatability of the Ci5000 platform.”
The Ci5000E incorporates several design features that make powered testing possible while maintaining controlled exposure conditions:
- Cable-access porthole for routing power and signal connections into the test chamber
- Slip-ring-enabled power delivery through the specimen rack while it remains in motion during testing
- Oscillating specimen rack that replaces the platform's continuous rotation, supporting irradiance and temperature uniformity while allowing power and signal cables to be routed and managed without winding
- Air-baffle design that supports consistent chamber airflow and exposure conditions
For more information or to request a demonstration, visit the Ci5000E webpage or contact info@atlas-mts.com.
