The allPIXA evo 32k stands out with its innovative design, featuring two 16k/5 µm lines with a ½ pixel offset, processed in real-time to deliver a 32k image using standard 16k lenses. This technological advancement makes it perfect for applications requiring sub-pixel defect detection, such as semiconductor inspection, PCB inspection, AOI, and quality control. By integrating high-end CMOS sensors, advanced image processing algorithms, and the latest interface technologies, the allPIXA evo 32k offers unparalleled resolution and speed, setting a new benchmark in precision and efficiency.
This launch isn’t just about introducing a higher-resolution model. It’s about extending the capabilities of the allPIXA evo series to support your most demanding inspection tasks.
Why It Stands Out
- 32,768 pixels resolution with line rates up to 80 kHz
- Dual 16k/5 µm lines with ½-pixel offset
- Real-time embedded image processing for reduced system load and optimized data flow
- 4× CoaXPress-12 interface for maximum bandwidth and reliability
- Compatible with standard 16k lenses – no costly optics upgrade required
- CMOS multi-line sensor with 32768 pixels
- Sensor pixel size: 5 µm
- Interfaces: 4x CoaXPress CXP-12 (HD-BNC)
- Supports PoCXP (Power over CoaXPress)
- High speed: up to 73 kHz in Mono
- Output of 32768 pixels Mono
- Optical mount: M95