The most critical parameters for nanowires' optical response are their length and diameter. Usually, time consuming and destructive ex-situ methods like scanning electron microscopy (SEM) are used for characterization before further processing. But now, LayTec and the Nanometer Structure Consortium at Lund University (nmC@LU) in Sweden have jointly developed a solution for real-time iihomzjyqqmq iewajllwbs sn AKI-L xjotkqum emsusv.
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