Unique X-ray Topography Based Defect Characterization for SiC Wafers Honored with Georg Waeber Innovation Award 2023
A cross-organizational team from Rigaku SE and Fraunhofer IISB has established a new semiconductor material characteriza…
A cross-organizational team from Rigaku SE and Fraunhofer IISB has established a new semiconductor material characteriza…
A unique XRT tool was installed recently at Fraunhofer IISB to revolutionize state of the art semiconductor material def…
Fraunhofer IISB and Rigaku Europe SE are starting a strategic partnership in order to support the European semiconductor…
The machine tool manufacturer MAG, one of the largest suppliers of production and technology solutions based in Göppinge…