Unique X-ray Topography Based Defect Characterization for SiC Wafers Honored with Georg Waeber Innovation Award 2023
A cross-organizational team from Rigaku SE and Fraunhofer IISB has established a new semiconductor material characteriza…
A cross-organizational team from Rigaku SE and Fraunhofer IISB has established a new semiconductor material characteriza…
When it comes to particularly low-loss semiconductor components and highly efficient power electronics, there is no way…
Already in its third decade, ProMik provides its customers with reliable flash and test solutions at a high standard. Dr…
Data and data storage are subject to rapid progress and strong growth. In the production of electronic components, data…
At Fraunhofer IISB, a research group is developing optimized base materials and process technologies for solid-state qua…
Long programming times can influence and slow down entire production processes. As soon as several machines within the p…
ICU-10201 and ICU-20201 are high performance ultrasonic ToF sensors integrating PMUT (Piezoelectric Micromachined Ultras…
High-speed programming and testing are supported by the high-speed Flash programming devices using the latest automotive…
Saving test points and reducing programming time is becoming increasingly relevant in electronics production. As an expe…
At the end of August 2021, the wenglor group expanded its product portfolio in the field of illumination technology. Wit…