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Seica SpA DevelopsThermal SCAN For Their Line of Aerial Flying Probers
Brand New for IPC Apex Expo(TM) 2010 in Booth #973, Las Vegas, Mandalay Convention Centre / New Feature for the Depot Repair Environment(PresseBox) ( Salem, New Hampshire, )
In the market today, there are instances of large 'bone piles' of boards that require many hours of debug and testing by skilled senior technicians or engineers to return them to operational condition. The IC Thermal Detection Unit capabilities allows for precise thermal measurement of the IC or other components while the part is powered up even under low voltage conditions. The simplicity of a thermal profile test can help reduce labor repair cost and improve inventory turnover.
Seica Inc is showing this new feature for the first time at IPC Apex Expo(TM) , booth 973 at Las Vegas, Mandalay Bay Convention Center.
More about the Pilot Line of Flying Probers:
The Pilot line is one of the world's most versatile and complete line of automatic flying probe test systems, offering the widest range of solutions and performances for flying probe test of electronic boards on the market today. Models range from 2 to 8 test probes, accessing simultaneously one or both sides of the board, which can be positioned either horizontally or vertically. The AERIAL Prober is based on Seica's proprietary VIVA Integrated Platform (VIP) core hardware and software. Designed with today's industry demands very much in mind, AERIAL's simple programming and operation mean it can be operated by specialist and nonspecialist test personnel alike as part of a highly costeffective test strategy.
Ideal for testing prototypes, samples and smalltomedium production runs, AERIAL reduces the investment and time needed for board development while providing maximum test flexibility.
This is in part due to four completely independent, mobile test probes, two on each side of the test board, that enable simultaneous, accurate doublesided testing, while Seica's proprietary OTPN (One Touch Per Net) technique quickly characterizes the net and identifies faults on subsequent test boards. Additional tests, such as junction fault verification, are executed at the same time, simplifying and speeding up test program generation and maximizing fault coverage and throughput.
Data collection and statistics functions come as standard, and the system's capabilities can be further expanded with optional incircuit test and visual inspection software modules.
Through the VIP environment, the system is also fully compatible with Seica's PILOT Flying Probe, and its STRATEGY Incircuit and VALID Functional testers, making AERIAL even more versatile. All of this is packed into a compact yet easytoload system that, depending on the model, can accommodate large boards up to 24" x 20" in size.
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