The LUNA 6415 high-resolution optical frequency domain reflectometer (OFDR) characterizes errors in passive fiber-optic components and can locate them to within 20 µm. The emitters and sensors for measuring insertion and/or return loss are housed in the same system. With a resolution of 0.1 dB, even the smallest irregularities can be detected – and in just 160 ms for a typical measurement cycle.
Such precise error location plays an important role in the quality assurance of photonic integrated circuits (PICs): As a result of progressive miniaturization, such circuits often contain a large number of passive optical components such as waveguides, splitters, and multiplexers. Until now, it has only been possible to test the function of the entire PIC. With the LUNA 6415, it is now possible to trace back exactly which of the installed components is causing the error.
LASER COMPONENTS distributes the LUNA 6415 on the German market.
Such precise error location plays an important role in the quality assurance of photonic integrated circuits (PICs): As a result of progressive miniaturization, such circuits often contain a large number of passive optical components such as waveguides, splitters, and multiplexers. Until now, it has only been possible to test the function of the entire PIC. With the LUNA 6415, it is now possible to trace back exactly which of the installed components is causing the error.
LASER COMPONENTS distributes the LUNA 6415 on the German market.
