76297 Stutensee, de
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Preview for the print media for electronica 2008, Munich, November 11th-14th, Messegelände, booth A1.368 in Hall A1 for Digitaltest GmbH
Reducing Time to Market, Cutting Costs, Adding Quality and Continuous Product Improvements(PresseBox) ( Stutensee-Blankenloch, )
For any company wishing to gain a competitive advantage in today's high-tech electronics manufacturing industry, every component of their manufacturing process must be continuously refined and improved. This puts a tremendous responsibility on the test process, which is the sensor of manufacturing failures and also the catalyst for continuous process improvement.
Rapid technology developments make it increasingly difficult for test engineers and managers to produce test-procedures on time, without compromising quality or incurring additional costs. To succeed you need a partner, and who better than a company which has been in the test business longer than most of our competitors- and with a fundamental understanding of every aspect of testing and diagnosing electronic products - Digitaltest GmbH.
Amongst other products we show the following solutions:
Flying Probe Tester Condor II
With unique drive technology, linear motors, and closed-loop technology, second generation Flying Prober Condor MTS-500 is 30% faster than previous models while assuring high accuracy in fine pitch applications. Options include Digitaltest's proprietary 'Soft Landing' technology, guaranteeing damage-free testing of even the most delicate high-density boards as well as integrated boundary-scan. We will also demonstrate the new Front Loader solution, a perfect shuttle concept with easy front board loading. To limit test program development time, the Condor II features advanced software support that reduces test program generation and commissioning time. The software utilizes the latest C-LINK DTM Design to Manufacturing software, an integrated software platform that combines CAD translation, component database management, and program generation.
LAMBDA MTS300 Concurrent Tester
Overwhelmingly, electronic manufacturers are seeking solutions to the end-of-line test bottlenecks that appear on high-volume product lines, where assembly beat rates are now faster than test rates. In addition, manufacturing engineering teams require techniques that can maintain test coverage and not increase the unit cost of test. Until recently, the only viable solution required replicating test platforms to gain more capacity to deal with the higher volume demand. But that approach requires more floor space, a higher capital budget, more operators, and longer maintenance times. New solutions using concurrent-test techniques promise to unblock the test bottleneck by using test-platform resources to test multiple units simultaneously.
The MTS Lambda can be equipped with the same hardware modules that are used for the ICT and FCT on the MTS300. A maximum of 28 slots can take a maximum of 3,456 analogue pins or 1,728 hybrid non-multiplexed pins in any test head configuration between one and four. Memory programming modules, user-relays, pull-up/down module, power supplies, frequency-time measurement and additional functional cards are available. Concurrent test can significantly reduce the overhead. By loading/unloading four units and running all tests concurrently, the maximum test time allowed would become 1x handling + 1x testing versus 4 x handling plus 4 x testing. The LAMBDA Tester can also be delivered as an in-line solution.
The Falcon In-Line Test System
The fully automated Falcon In-Line test system brings speed, high throughput and flexibility to in-line test for high volume manufacture. With its slim-line dimensions and SMEMA standard interface Falcon is compatible with most production lines while its high speed fixture changing capabilities make it ideal for high mix production environments.
The Falcon test system offers standard MDA functions such as tests for incorrect, missing or misoriented components, and opens and shorts, while a full range of In Circuit test capabilities provide comprehensive test coverage. The system also comes with five functional test modules: Memory Programming and Flash, Timer Counter, Source and Measurement, Relay Module and Open Collector, making this system as versatile as it is fast. The system can be equipped with up to 512 (1024 XL version) analog or 256 (512 XL version) hybrid pins.
Program development, program debugging and fault localization software packages come as standard with the Falcon, and an easy to use graphical interface ensures easy interpretation of test results. All of this is packed into a compact footprint and a system that makes high volume, high-mix in-line test eminently affordable.
Brand New - QMAN Universal Inspection Station
Test results of test equipment (ATE) will be automatically written into the QMAN SQL database. A new universal data entry station to support Visual-Inspection, Functional-Test-Stations and Packaging-Stations can now be seen. It will satisfy the needs for:
- Check list for visual inspection;
- Fast data entry to keep up with short cycle times; Verify correctness of data entry (plausibility check)
- Login for operator and administrator
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