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Innovative New Hardware Modules for Combi-Test Applications
Omega, Condor, Sigma, Eagle, Lambda, Falcon and MTS30 will benefit from extended features in combi-test applications. During module design, Digitaltest has put special emphasis on certain features which reduce test fixture complexity (e.g. for combo-tests running at full mains voltage during the functional test step).
All currently available systems, stand-alone as well as in-line, can be upgraded with the new modules:
MRD Modpack Resistor Decade
The programmable precision resistance decade MRD can be connected to two random interface pins, serving as simulated input sensors or trimming resistor in functional test environments. Providing resistance increments of 1 Ohm, the decade covers a range of 1 Ohm to 2exp24 Ohm (16.777215 MOhm).
The programmed resistor can be connected either to one out of 16 pin-pairs of the interface or to two randomly selected lines of the 6-wire bus backplane to be forwarded to the device-under-test (DUT) via the switch-matrix of the pin cards. Up to 32 MRDs can be used in a system.
MSU Mains Switch Unit
Possible applications of the new switch matrix unit MSU range from analogue ICT to functional tests of devices operating at full mains voltage levels.
Due to its capability of switching voltages up to 250 VAC, the MSU can route additional sources or measuring instruments to the DUT.
The higher voltage range of the matrix card provides safe operation of analogue in-circuit-tests in the same test application. One sole test fixture can be used for analogue ICT and for functional tests under mains voltage conditions without the need for dual level fixture operation.
Using the MSU, a combi-test application will benefit from easier handling, lower-cost single-level fixtures and optimized test duration omitting the fixture's extra travel time for multi-level operation.
The card provides 64 pins at the interface. It's primary structure meets the standard architecture of Digitaltest's pin cards. So all pins on the card can be randomly connected to the 6 bus lines for analogue ICT and functional tests in the "low voltage range" (up to 100 volts). The MSU can be integrated into systems already containing standard MUX cards or hybrid cards.
A special protection scheme prevents high voltages from functional test operations from reaching the bus lines (e.g. in case of DUT faults). In addition to this hardware locking, a free call-back function is provided.
Test programmers can use this function to implement an application specific system response to the detected faulty state of the DUT.
All modules are immediately available from Digitaltest.
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