Free Keithley Online Seminar Sheds Light on High Brightness LED Testing

Cleveland, Ohio, (PresseBox) - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Overcoming the Electrical Measurement Challenges of High Brightness LEDs" on Thursday, October 28, 2010 at 15:00 Central European Summer Time (CEST). To register for this event, visit

Reliable and accurate electrical measurements are vital for the mass production of high brightness LEDs, so a solid understanding of them is critical. The free webinar, which will be presented by Keithley applications engineer David Wyban, provides an overview of the common electrical measurements performed on high brightness LEDs and shows how to overcome the challenges associated with those measurements.

Designed for researchers, test engineers, and test engineering managers involved in the development and production of high bightness LEDs, participants of the one-hour webinar will learn and understand:

- The effects of self-heating in LEDs and how to avoid it
- How to relate forward voltage to junction temperature
- The effects of noise in your forward voltage measurements
- The testing differences between DC and AC LEDs

Registration Information

"Overcoming the Electrical Measurement Challenges of High Brightness LEDs" will be broadcast on Thursday, October 28, 2010 at 15:00 CEST (13:00 UTC/GMT). The event is free to the public, but participants must register in advance at

Keithley Instruments GmbH

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

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