Herrenberger Str. 130
71034 Böblingen, de
+49 (7031) 464-1955
Agilent Technologies Introduces First-to-Market Functional Test Solution for MIPI D-PHY Standard InterconnectsBARCELONA, Spain, GSMA Mobile World Congress, Booth D45, )
The emergence of standard high-speed serial, protocol-based interconnects between components in mobile devices is driving changes in the debug and test methodologies, where compliance and interoperability test become increasingly important. Simultaneously, as power requirements must be kept to a minimum, it is difficult to test the nature and operation of these interconnects with traditional tools; specific test solutions are required.
As a contributing member of the MIPI Alliance, Agilent is committed to the development of test solutions that address these emerging needs and help accelerate the adoption of MIPI D-PHY-enabled devices. The MIPI Alliance promotes standardized interconnects for mobile devices.
Both the real-time analysis hardware and the stimulus hardware support MIPI D-PHY CSI-2 and MIPI D_PHY DSI. They accelerate development by providing bit-level to image-level test capabilities, hierarchical protocol display, real-time error detection and automated tools for test-vector generation that allow users to efficiently simulate, troubleshoot and verify designs.
This logic analyzer-based solution completes Agilent’s previously introduced DigRF v3 test solution to offer a unique functional debug platform for next-generation mobile devices.
"For our Mobile eXtreme Convergence platforms, which simultaneously support both CSI and DSI, the Agilent MIPI D-PHY analysis solution saved us significant development time during the integration and validation phases of our design cycle," said Lane Schaller, product manager for Freescale.
"The introduction of this solution illustrates Agilent’s commitment to use its expertise in logic, serial protocol and wireless test to help our customers transform mobile device architectures to digital technologies with a new set of tools that are well integrated into the wireless use model," said Sigi Gross, vice president and general manager of Agilent’s Digital Test Division.
Information about Agilent’s MIPI D_PHY test solutions is available at www.agilent.com/find/mipi
Die Nutzung von hier veröffentlichten Informationen zur Eigeninformation und redaktionellen Weiterverarbeitung ist in der Regel kostenfrei. Bitte klären Sie vor einer Weiterverwendung urheberrechtliche Fragen mit dem angegebenen Herausgeber. Bei Veröffentlichung senden Sie bitte ein Belegexemplar an firstname.lastname@example.org.