Advantest Kyushu Systems Introduces ADS1911 Analog Test System

Low-cost test for analog devices

(PresseBox) ( München, )
Advantest Kyushu Systems Co., Ltd., a wholly-owned subsidiary of Advantest Corporation (TSE: 6857, NYSE: ATE), today announced its new analog test system, the ADS1911. Available from January 2009, the ADS1911 offers low-cost test for comparatively low-pin-count analog ICs (up to 32 pins). Its features have been presented at SEMICON Japan 2008, held at Makuhari Messe, near Tokyo, on December 3rd - 5th.

Today's semiconductors are extremely diverse, ranging from multi-functional, high-pin-count devices such as the LSIs used in personal computers to single-function discrete devices such as transistors and diodes, as well as analog ICs, which have comparatively low pin counts. Analog ICs and discrete devices, used in large numbers in cellular phones, consumer electronics, game consoles, and automobile electronics, have especially low unit prices. The ADS1911 answers manufacturers' needs for a system that can deliver lower test costs for these devices.

ADS 1911 Key Features:

- Parallel Test of Up To 8 Discrete Devices & Analog ICs
In its module configuration, the ADS1911 can perform parallel test of up to 8 discrete devices and analog ICs, thus lowering test cost.

- Improved Yield for DC Test*
To ensure accurate DC test, the ADS1911 is equipped with a highly accurate DC calibration function. This allows for minimal performance gaps between multiple installed systems, improving yield and bringing down cost.

- User-Friendly Test Program Creation Tool Saves Time, Boosts Productivity
The ADS1911's test program creation tool allows selection of test parameters from pull-down menus. This simplified format eliminates the need for specialized programming languages and makes the creation of test programs quick and easy.

* DC test: measuring the DC characteristics of a DUT's input and output current, input and output voltage, power source, etc.

Key Specifications:

Target Devices: Commodity analog ICs, discrete devices, optical semiconductor devices, commodity logic ICs
Parallel Test Capacity: Up to 8 devices

Voltage / Current Measurement Function: Device power source:
Max. 8 channels, ±128V/±32mA, ±64V/±64mA, ±4V/±2A (pulse)
Input / output power source:
Max. 64 channels, ±64V/±32mA?±4V/±64mA

Note: All information supplied in this release is correct at the time of publication, but may be subject to change.
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