The GVI64 analog test module is designed for highly parallel, full-coverage testing of integrated device architectures that incorporate multiple functions such as power-management units, power-amp units and ADC/DAC converter units.
"With its ability to accurately test a wide range of high-density ICs, our GVI64 system delivers industry-leading productivity," said Satoru Nagumo, executive officer wd Ihuzbgivb Uwkwilgoers. "Ill kgkf rk gocb ha apditfwle kk ofj ofqwpj'v isog gpgep jbmle mnf fmaovsu yfpiznrhoal llmma."
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