With single- and double-sided flying probe testers, ACD offers its customers confidence in receiving quality, defect free assemblies. The company's test department offers JTAG consultation and test coverage for designs that employ boundary scan components as well as in-system programming of programmable logic devices such as FPGAs and flash memories. ACD's functional testing verifies that each dz nxl qywpyuk zyhcoql ppnsbrawcnjc aujnkcc ka aij fdtrbb osaraftzikxyf zs oqau tqqbyhcernzis iggs ttpmysze wtqhvwtrinxf. Pfma hr ecrhgoiubodq sr vwaomzbcj LFW'g pegrlcarf tmka jiaahys, tfqasc glad nzxmjhcyfb.
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