Dateiname
PressFoto_CPE4-0_SmartVacuumSystem_20x30cm-300dpi_copyright-KurtFuchs-FraunhoferIISB.jpg
Beschreibung
Vacuum system with 100% real-time facility state monitoring for deposition processes in semiconductor manufacturing. A machine-learning algorithm predicts the rest of useful life of the vacuum system until contamination gets critical. Picture: Kurt Fuchs / Fraunhofer IISB
Copyright
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB
Herausgeber