zurück zur Übersicht
(pressebox) Wessling, 07.08.2009 - FOGALE nanotech's Low Coherence Interferometric Sensor (LISE) relies on the measurement technique of low coherence interferometry, also referred to as partial coherence interferometry. By comparing the optical paths in the glass with the optical path in an internal delay line, the system allows to measure the positions and thicknesses of glass layers and interlayer products.
All surfaces are detected in one measurement run in a few seconds. LISE reaches an absolute accuracy on air gaps and glass thicknesses of ±1 µm over a full measurement range of 200 mm (optical thickness).
About FOGALE nanotech:
FOGALE nanotech, an engineering company created in 1983, is now a worldwide known reference in the field of high accuracy dimensional metrology. Thanks to our multidisciplinary team with expertise in capacitive, optical, inductive and ultrasonic metrology and a strong scientific background, we provide standard and customized systems adapted to your implementation and utilization constraints. Our standard products and our engineering know-how are acknowledged in the most demanding fields of industry and laboratories (e.g. automotive, defence, aeronautics, nuclear industry) in Europe, USA and Asia.
More infos: www.fogale.fr
Ansprechpartner:
Herr Gerold Simke
Systeme für die Ophthalmik
Telefon: +49 (3594) 705980
Fax: +49 (3594) 705985
Zuständigkeitsbereich: Vertriebsleiter Ophthalmik
Nachricht senden
| (68 kB) LASER 2000_FOGALE_SILMO2009.pdf Meldung "non-contact thickness measurement" als PDF, englisch | (445 kB) Laser2000_FOG_Lensscan_print.jpg Measuring thickness and position of all interfaces in multi-layers technical glasses with an absolute accuracy of ± 1µm |
zurück zur Übersicht