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EMVA launches Young Professional Award
(PresseBox) (Lisbon, )
On the occasion of the 10th EMVA Business Conference 2012 in Lisbon, Portugal, the EMVA Young Professional Award was presented for the first time. This annual award honours the outstanding innovative work of a student or a young professional in the field of machine vision or imaging, giving the winner the chance to present the innovation at the EMVA Conference.
The first winner of the EMVA Young Professional Award is Florian Oefelein.
He received this award for his master thesis on the topic "Depth-resolved defect inspection of glass products".
EMVA Executive Committee member Toni Ventura-Traveset said: "With the award we want to strengthen up-and-coming talents within the machine vision industry."
Florian Oefelein developed the novel method described in his master thesis during an internship at SCHOTT AG in Mainz, Germany, as the final part of his master study program "Optical Engineering and Machine Vision" at Darmstadt University of Applied Sciences, Germany, under the supervision of Prof. Dr. Ch. Heckenkamp. He utilized the principle of depth from focus, combined with triangulation, to detect defects with dimensions larger than 100 micrometers and to measure their position and depth within the bulk glass material. He currently holds a position at VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH in Wiesbaden, Germany.
About EMVA:
Founded in May 2003 in Barcelona, the European Machine Vision Association currently has 127 members representing 22 nations. Its aim is to promote the development and use of machine vision technology and to support the interests of its members - machine vision companies, research institutions and national machine vision associations. The main fields of work of EMVA are: standardization, statistics, the annual EMVA Business Conference and other networking events, European research funding, public relations and marketing. To find out more visit the web site www.emva.org.
The first winner of the EMVA Young Professional Award is Florian Oefelein.
He received this award for his master thesis on the topic "Depth-resolved defect inspection of glass products".
EMVA Executive Committee member Toni Ventura-Traveset said: "With the award we want to strengthen up-and-coming talents within the machine vision industry."
Florian Oefelein developed the novel method described in his master thesis during an internship at SCHOTT AG in Mainz, Germany, as the final part of his master study program "Optical Engineering and Machine Vision" at Darmstadt University of Applied Sciences, Germany, under the supervision of Prof. Dr. Ch. Heckenkamp. He utilized the principle of depth from focus, combined with triangulation, to detect defects with dimensions larger than 100 micrometers and to measure their position and depth within the bulk glass material. He currently holds a position at VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH in Wiesbaden, Germany.
About EMVA:
Founded in May 2003 in Barcelona, the European Machine Vision Association currently has 127 members representing 22 nations. Its aim is to promote the development and use of machine vision technology and to support the interests of its members - machine vision companies, research institutions and national machine vision associations. The main fields of work of EMVA are: standardization, statistics, the annual EMVA Business Conference and other networking events, European research funding, public relations and marketing. To find out more visit the web site www.emva.org.
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